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首页 > 产品介绍 > VIKING 光颉电感 > VIKING高频电感 > CL系列
产品介绍 CL系列高频陶瓷迭层电感规格书
Multilayer Chip Inductor-CL Series
  ■Construction

■Features

-A ceramic material construction for high frequency application up to 10GHz
-Tight tolerance physical dimensions(+/-0.05mm)
-Tight inductance tolerance and excellent Qvalue
-Available in three compact sizes of 0201,0402, 0603

 

■Applications

-High Frequency Application
-Cellular Phone
-EMI Countermeasure in High Frequency Circuits and Computer Communication etc.

-WLAN and RF module

Ceramic Material

Inner Electrode(Ag)

Direction Mark

Through Hole

End-termination (Ag/Ni/Sn)

 

 

 

■Dimensions

Type

Size

(Inch)

L W

T

A

(min./max.)

Weight

(g)

1000pcs)

CL01 0201 0.6±0.03 0.3±0.03 0.33max. 0.1/0.2 0.28
CL02 0402 1.0±0.10 0.5±0.10 0.5±0.10 0.1/0.3 0.98
CL03 0603 1.6±0.15 0.8±0.15 0.8±0.15 0.2/0.3 3.47
■Part Numbering

CL
02
J
T
10N
Product
Type
Dimensions
01:0201
02:0402
03:0603
Inductance
Tolerance

J:±5%
K:±10%

S:±0.3nH

Packaging
Code
T:Taping Reel
Inductance
1N0:1.0nH
39N:39nH
R10:100nH
         
         
 


■Electrical Specifications

CL01 Multilayer Chip Inductors Type

Inductance
(nH)

Tolerance

Quality
Factor
min.

L/Q
Freq.
(MHz)

Q (Typical)
Freq. (MHz)

SRF
(GHz) min.

DCR
(Ω) max.

IDC
(mA) max.

100

500

800

0.3

±0.3nH

4

100

5

13

18

10

0.07

250

0.4

±0.3nH

4

100

5

13

18

10

0.07

250

0.5

±0.3nH

4

100

5

13

18

10

0.08

250

0.6

±0.3nH

4

100

5

13

18

10

0.08

250

0.7

±0.3nH

4

100

5

13

18

10

0.09

250

0.8

±0.3nH

4

100

5

13

18

10

0.10

250

0.9

±0.3nH

4

100

5

13

18

10

0.10

250

1

±0.3nH

4

100

5

15

19

10

0.14

250

1.1

±0.3nH

4

100

5

15

19

10

0.14

250

1.2

±0.3nH

4

100

6

15

20

10

0.14

250

1.3

±0.3nH

4

100

6

15

20

10

0.14

250

1.5

±0.3nH

4

100

6

15

20

10

0.18

230

1.6

±0.3nH

4

100

6

15

20

10

0.18

230

1.8

±0.3nH

4

100

6

15

20

10

0.19

200

2

±0.3nH

4

100

6

15

20

8.8

0.20

200

2.2

±0.3nH

4

100

6

15

20

8.8

0.22

200

2.4

±0.3nH

4

100

6

15

20

8.3

0.24

200

2.7

±0.3nH

5

100

6

16

20

7.7

0.25

200

3

±0.3nH

5

100

6

16

20

7.2

0.28

180

3.3

±0.3nH

5

100

6

16

20

6.7

0.30

180


CL01 Multilayer Chip Inductors Type


Inductance
(nH)

Tolerance

Quality
Factor
min.

L/Q
Freq.
(MHz)

Q (Typical)
Freq. (MHz)

SRF
(GHz) min.

DCR
(Ω) max.

IDC
(mA) max.

100

500

800

3.6

±0.3nH

5

100

6

16

20

6.4

0.30

170

3.9

±0.3nH

5

100

7

16

20

6.0

0.30

170

4.3

±0.3nH

5

100

7

16

20

5.7

0.40

150

4.7

±0.3nH

5

100

7

16

20

5.3

0.40

150

5.1

±0.3nH

5

100

7

16

20

5.0

0.40

150

5.6

±0.3nH

5

100

7

16

20

4.2

0.40

150

6.2

±5%

5

100

7

16

20

3.8

0.44

150

6.8

±5%

5

100

7

16

20

3.5

0.50

150

7.5

±5%

5

100

7

15

20

3.3

0.53

150

8.2

±5%

5

100

7

15

20

3.2

0.55

150

9.1

±5%

5

100

7

15

20

3.0

0.62

150

10

±5%

5

100

7

15

19

2.8

0.65

150

12

±5%

5

100

7

14

18

2.4

0.70

100

15

±5%

5

100

7

14

18

2.2

0.80

100

18

±5%

5

100

7

14

18

2.1

0.90

100

22

±5%

5

100

7

14

18

1.8

1.20

100

27

±5%

4

100

6

13

16

1.8

1.80

50

33

±5%

4

100

6

12

14

1.7

2.10

50

39

±5%

4

100

6

12

14

1.5

2.40

50

47

±5%

4

100

6

11

13

1.3

2.80

50

56

±5%

4

100

6

11

12

1.1

3.00

50


CL02 Multilayer Chip Inductors Type


Inductance
(nH) 
Tolerance Quality
Factor
min.
 L/Q
Freq.
(MHz)
Q (Typical)
Freq. (MHz)
SRF
(GHz) min. 
DCR
(Ω) max. 
IDC
(mA) max. 
100 500 800 900 1800 2000 2400
1 ±0.3nH 8 100 9 25 34 36 57 63 73 10.0 0.12 300
1.1 ±0.3nH 8 100 9 25 34 36 57 63 73 10.0 0.12 300
1.2 ±0.3nH 8 100 11 28 37 40 63 70 82 10.0 0.12 300
1.3 ±0.3nH 8 100 11 29 39 42 65 73 85 10.0 0.13 300
1.5 ±0.3nH 8 100 11 27 35 38 38 65 75 6.00 0.13 300
1.6 ±0.3nH 8 100 11 30 39 42 64 71 81 6.00 0.14 300
1.8 ±0.3nH 8 100 11 28 36 40 57 61 73 6.00 0.14 300
2 ±0.3nH 8 100 11 26 34 37 55 61 68 6.00 0.16 300
2.2 ±0.3nH 8 100 10 23 30 32 48 52 61 6.00 0.16 300
2.4 ±0.3nH 8 100 10 24 30 33 48 52 61 6.00 0.17 300
2.7 ±0.3nH 8 100 12 29 38 42 42 67 74 6.00 0.17 300
3 ±0.3nH 8 100 11 27 34 37 53 58 67 6.00 0.19 300
3.3 ±0.3nH,±10% 8 100 10 25 32 34 49 52 60 6.00 0.19 300
3.6 ±0.3nH,±10% 8 100 10 23 30 32 46 50 56 5.00 0.22 300
3.9 ±0.3nH,±10% 8 100 11 26 33 35 50 54 61 4.00 0.22 300
4.3 ±0.3nH,±10% 8 100 10 23 29 31 43 46 50 4.00 0.24 300
4.7 ±0.3nH,±10% 8 100 10 23 30 33 46 49 55 4.00 0.24 300
5.1 ±0.3nH,±10% 8 100 11 25 32 35 47 49 52 4.00 0.27 300
5.6 ±0.3nH,±10% 8 100 11 25 32 35 47 49 52 4.00 0.27 300
6.2 ±0.3nH,±10% 8 100 11 25 31 33 45 47 52 3.90 0.32 300
6.8 ±5,±10% 8 100 11 25 31 34 45 48 51 3.90 0.32 300
8.2 ±5,±10% 8 100 11 25 31 34 43 44 44 3.50 0.37 300
10 ±5,±10% 8 100 11 24 31 33 39 39 37 3.20 0.42 300
12 ±5,±10% 8 100 11 24 31 33 39 39 37 2.60 0.50 300
15 ±5,±10% 8 100 11 23 30 32 35 33 28 2.30 0.55 300
18 ±5,±10% 8 100 11 23 30 30 29 27 18 2.00 0.65 300
22 ±5,±10% 8 100 12 24 30 31 27 24 14 1.60 0.80 300
27 ±5,±10% 8 100 11 24 29 30 21 16 2 1.40 0.90 300


CL02 Multilayer Chip Inductors Type

Inductance
(nH)

Tolerance

Quality
Factor
min.

L/Q
Freq.
(MHz)

Q (Typical)
Freq. (MHz)

SRF
(GHz) min.

DCR
(Ω) max.

IDC
(mA) max.

100

500

800

900

1800

2000

2400

33

±5,±10%

8

100

12

23

26

27

11

4

-

1.20

1.00

200

39

±5,±10%

8

100

11

22

24

24

1

-

-

1.10

1.20

200

47

±5,±10%

8

100

11

21

23

23

-

-

-

0.90

1.30

200

56

±5,±10%

8

100

11

21

22

22

-

-

-

0.75

1.40

200

68

±5,±10%

8

100

12

21

21

19

-

-

-

0.75

1.40

180

82

±5,±10%

8

100

11

18

15

13

-

-

-

0.60

1.60

150

100

±5,±10%

8

100

11

19

15

12

-

-

-

0.60

1.60

150

120

±5,±10%

8

100

11

15

7

2

-

-

-

0.60

1.60

150

150

±5,±10%

8

100

12

18

9

4

-

-

-

0.55

2.40

140


CL03 Multilayer Chip Inductors Type

Inductance
(nH)
Inductance
Tolerance
(nH or %)
Quality
Factor
min. 
L/Q
Freq.
(MHz)
Q (Typical)
Freq. (MHz)
SRF(GHz) min. DCR(Ω) max. IDC(mA) max.
100 500 800
1 ±0.3nH 8 100 15 36 49 6.0 0.10 500
1.2 ±0.3nH 8 100 15 36 49 6.0 0.10 500
1.5 ±0.3nH 8 100 14 34 47 6.0 0.10 500
1.8 ±0.3nH 8 100 17 40 55 6.0 0.10 500
2.2 ±0.3nH 8 100 15 38 49 6.0 0.10 500
2.7 ±0.3nH 8 100 14 37 48 6.0 0.10 500
3.3 ±0.3nH,±10% 10 100 16 40 51 6.0 0.13 500
3.9 ±0.3nH,±10% 10 100 14 36 48 6.0 0.15 500
4.7 ±0.3nH,±10% 10 100 14 37 48 4.0 0.20 500
5.6 ±0.3nH,±10% 10 100 14 36 46 4.0 0.23 500
6.8 ±5,±10% 10 100 15 37 48 3.75 0.25 500
8.2 ±5,±10% 10 100 16 39 50 3.30 0.28 500
10 ±5,±10% 12 100 16 37 47 3.0 0.30 300
12 ±5,±10% 12 100 15 36 45 2.6 0.35 300
15 ±5,±10% 12 100 16 38 48 2.3 0.40 300
18 ±5,±10% 12 100 17 38 47 2.0 0.45 300
22 ±5,±10% 12 100 18 40 49 1.6 0.50 300
27 ±5,±10% 12 100 18 40 47 1.4 0.55 300
33 ±5,±10% 12 100 17 40 46 1.2 0.60 300
39 ±5,±10% 12 100 19 40 46 1.1 0.65 300
47 ±5,±10% 12 100 17 36 39 0.9 0.70 300
56 ±5,±10% 12 100 18 36 37 0.9 0.75 300
68 ±5,±10% 12 100 18 35 36 0.7 0.85 300
82 ±5,±10% 12 100 18 33 29 0.6 1.00 300
100 ±5,±10% 12 100 18 28 16 0.6 1.20 300
120 ±5,±10% 8 50 - - - 0.5 2.30 250
150 ±5,±10% 8 50 - - - 0.5 2.40 250
180 ±5,±10% 8 50 - - - 0.4 2.70 250
220 ±5,±10% 8 50 - - - 0.4 3.00 250

■Environmental Characteristics


Electrical Performance Test

Item

Requirement

TestCondition

Inductance

In within specified tolerance

a. Temperature: 25±1°C
b. Relative Humidity: 45 to 85%RH
c. Atmospheric Pressure: 86 to 106kpa
d. Measuring equipment and fixture:
0201: HP4291B+Agilent16196C
0402: HP4291B+Agilent16193A
0603: HP4291B+Agilent16192A

Q Value

In accordance with electrical specification

a. Temperature: 25±1°C
b. Relative Humidity: 45 to 85%RH
c. Atmospheric Pressure: 86 to 106kpa

DC Resistance

In accordance with electrical specification

a. Temperature: 25±1°C
b. Relative Humidity: 45 to 85%RH
c. Atmospheric Pressure: 86 to 106kpa
d. Measuring equipment: HP 4338

Temperature
Characteristics

Within specified tolerance

a. Temperature range: -30 to﹢85°C
b. Reference temperature: 25°C



Mechanical Characteristies Test

Item

Requirement

TestCondition

Bending Strength

No mechanical damage shall be observed

Solder the chip to test jig then apply a force in the direction shown in below. The soldering shall be done with the reflow method and shall be conducted with care so that the soldering is uniform and free of defects such as heat shock.

 

Solderability

More than 75% of the terminal electrode part shall be covered with fresh solder

Immerse a test sample into a methanol solution containing rosin,preheat it at 150 to 180°C for 3 to 5 seconds and immerse into molten solder of 245±5°C for 5±0.5 seconds.

Resistance
to Soldering Heat

No visible damage

Immerse a test sample into a methanol solution containing resin, preheat it at 150 to 180°C for 2 to 3 minutes and immerse into molten solder of 260±5°C for 10±0.5 seconds so that both terminal electrodes are completely submerged.

Appearance

In accordance with specification

Inductors shall be visually inspected for visible evidence of defect

Dimension

In accordance with dimension specification

Dimension shall be measured with caliper or micrometer



Climatic Test



Item

Requirement

TestCondition

Thermal Shock

No visible damage
Inductance variation within 10%
Q variation within 20%

Solder a test sample to printed circuit board, and conduct 100
cycles of test under the conditions shown as below.
Cycle:

Thermal Shock
High Humidity State Life

No visible damage
Inductance variation within 10%
Q variation within 20%

Keep a test sample in an atmosphere with a temperature of
70±2°C, 90~95%RH for 500±12 hours. After the test, keep the
test sample at a normal temperature for 1 to 2 hours, and then
carry out measurement.

High Humidity Load Life

No visible damage
Inductance variation within 10%
Q variation within 20%

Solder a test sample to printed circuit board then keep the test
sample in an atmosphere with a temperature of 70±2°C,
90~95%RH for 500±12 hours while supplying the rated current.
After the test, keep the test sample at a normal temperature for 1
to 2 hours, and then carry out measurement.

High Temperature State Life

No visible damage
Inductance variation within 10%
Q variation within 20%

Keep a test sample in an atmosphere with a temperature of
100±2°C for 500±12 hours. After the test, keep the test sample
at a normal temperature for 1 to 2 hours, and then carry out
measurement.

High Temperature Load

No visible damage
Inductance variation within 10%
Q variation within 20%

Solder a test sample to printed circuit board then keep the test
sample in an atmosphere with a temperature of 100±2°C for
500±12 hours while supplying the rated current. After the test,
keep the test sample at a normal temperature for 1 to 2 hours,
and then carry out measurement.


■Storage Temperature: 25±3°C; Humidity 80%RH

■Packaging

Reel Dimensions Unit: mm

Type

A

B

C

W

T

Quantity(EA)

CL01

178±1

60.2±0.5

13.0±0.20

9.00±0.5

12.0±0.15

15000

CL02

178±1

60.2±0.5

13.0±0.20

9.00±0.5

12.0±0.15

10000

CL03

178±1

60.0+0.5

13.0±0.20

9.00±0.5

12.0±0.15

4000








  Unit: mm

Type

A

B

T

W

P

F

CL01

0.38

0.68

0.42

8

2

3.5

CL02

0.65

1.12

0.6

8

2

3.5

CL03

1.1

1.8

0.95

8

4

3.5


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